• X-ray diffraction for structure determination of crystalline materials: fundamentals, practical
use, indexing, phase identification, and pole figure measurements for texture analysis
• Total scattering of X-rays and analysis of the pair distribution function (PDF) for nanostructured and amorphous materials
• Small angle scattering (SAXS) for obtaining structure information on the nanoscale
• EXAFS (Extended X-ray absorption fine structure) for determining the local structure of an atom in crystalline as well as amorphous materials
• Computed tomography with a focus on X-ray CT: micro-CT, reconstruction, visualization and analysis of 3D images, and applications
• EPR (Electron paramagnetic resonance) and ENDOR (Electron nuclear double resonance) for the study of defects using magnetic resonance
• Seminars on selected modern techniques for structural analysis: student seminar on a selected topic.
Final competences:
1 Apply advanced knowledge of theories, models, methods, techniques, processes and
applications in materials research to analyze and solve complex problems.
2 Analyze, evaluate and structurally synthesize information from scientific literature on
experimental solid state physics.
3 Show a professional attitude which is a sign of openness to new scientific developments and their applications in a broad scientific, economic or social context.
4 Present personal research, ideas, thoughts, views or proposals appropriately orally or in
writing, both in Dutch and English.
